Article
Genetic architecture of highly complex chemical resistance traits across four yeast strains.
PLoS genetics - 1 Jan 2012
Ehrenreich Ian M, Bloom Joshua, Torabi Noorossadat, Wang Xin, Jia Yue, Kruglyak Leonid
Abstract excerpt
Many questions about the genetic basis of complex traits remain unanswered. This is in part due to the low statistical power of traditional genetic mapping studies. We used a statistically powerful approach, extreme QTL mapping (X-QTL), to identify the genetic basis of resistance to 13 chemicals in all 6 pairwise crosses of four ecologically and genetically diverse yeast strains, and we detected a total of more...
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