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Statistical model for degraded DNA samples and adjusted probabilities for allelic drop-out.

Forensic science international. Genetics - 1 Jan 2012

Tvedebrink Torben, Eriksen Poul Svante, Mogensen Helle Smidt, Morling Niels

Abstract excerpt

DNA samples found at a scene of crime or obtained from the debris of a mass disaster accident are often subject to degradation. When using the STR DNA technology, the DNA profile is observed via a so-called electropherogram (EPG), where the alleles are identified as signal peaks above a certain level or above a signal to noise threshold. Degradation implies that these peak intensities decrease in strength for...

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PMID: 21458395
DOI: 10.1016/j.fsigen.2011.03.001

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