Article

Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201' and ‘Chirya 3'

2010-10-01

Abstract excerpt

Spot blotch caused by Bipolaris sorokiniana is a destructive disease of wheat in warm and humid wheat growing regions of the world. To identify quantitative trait loci (QTLs) for spot blotch resistance, two mapping populations were developed by making the crosses between common susceptible cultivar ‘Sonalika' with the resistant breeding lines ‘Ning 8201' and ‘Chirya 3'. Single seed descent derived F₆, F₇, F₈ lines...

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Literature Corpus work: dbc10488-fdcb-56ee-8695-d76c95792fb1
DOI: 10.1007/s11032-009-9388-2

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