Article
Identification and fine mapping of spot blotch (Bipolaris sorokiniana) resistance gene Sb4 in wheat.
TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik - 1 Aug 2020
Zhang Panpan, Guo Guanghao, Wu Qiuhong, Chen Yongxing, Xie Jingzhong, Lu Ping, Li Beibei, Dong Lingli, Li Miaomiao, Wang Rongge, Yuan Chengguo, Zhang Huaizhi, Zhu Keyu, Li Wenling, Liu Zhiyong
Abstract excerpt
KEY MESSAGE: A new spot blotch (Bipolaris sorokiniana) resistance gene Sb4 was mapped in a genomic interval of 1.34 Mb on wheat chromosome 4BL. Spot blotch, caused by Bipolaris sorokiniana, has emerged as a serious concern for cultivation of wheat in warmer and humid regions of the world, which results in substantial yield losses and descends with quality. In this study, we identified and mapped a spot blotch...
Read the complete abstract on PubMedTopics
Share this publication in a Topic to start or enrich a Post.
