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Quantitative Trait Loci Mapping for Spot Blotch Resistance in Two Biparental Mapping Populations of Bread Wheat.

Phytopathology - 1 Dec 2020

He Xinyao, Dreisigacker Susanne, Sansaloni Carolina, Duveiller Etienne, Singh Ravi P, Singh Pawan K

Abstract excerpt

Spot blotch (SB), caused by Bipolaris sorokiniana, is a major fungal disease of wheat in South Asia and South America. Two biparental mapping populations with 232 F2:7 progenies each were generated, with CIMMYT breeding lines CASCABEL and KATH as resistant parents and CIANO T79 as the common susceptible parent. The two populations were evaluated for field SB resistance in CIMMYT's Agua Fria station for three...

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PMID: 32635797
DOI: 10.1094/PHYTO-05-20-0197-R

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Quantitative Trait Loci Mapping for Spot Blotch Resistance in Two Biparental Mapping Populations of Bread Wheat.PMID 32635797Read ↗

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