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A Lightweight, Low-Label Framework Towards Autonomous Morphology-Resolved SEM–EDS Analysis in Material Microscopy

2026-08-04

Abstract excerpt

<title>Abstract</title> <p>High-throughput materials characterization is essential for self-driving laboratories, yet it is often the slowest and least automated step, largely because extracting meaningful structure–property relationships from complex, multimodal data still requires substantial expert interpretation. This is particularly true for nanomaterials, whose properties are highly sensitive to structure,...

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Literature Corpus work
a7df75e4-3f00-5841-9c21-3133bd6cb992
DOI
10.21203/rs.3.rs-10521147/v1
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A Lightweight, Low-Label Framework Towards Autonomous Morphology-Resolved SEM–EDS Analysis in Material MicroscopyDOI 10.21203/rs.3.rs-10521147/v1
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