Article
A Lightweight, Low-Label Framework Towards Autonomous Morphology-Resolved SEM–EDS Analysis in Material Microscopy
2026-08-04
Abstract excerpt
<title>Abstract</title> <p>High-throughput materials characterization is essential for self-driving laboratories, yet it is often the slowest and least automated step, largely because extracting meaningful structure–property relationships from complex, multimodal data still requires substantial expert interpretation. This is particularly true for nanomaterials, whose properties are highly sensitive to structure,...
Topics
Open a Topic to create a Post that cites this publication.
Identifiers and source
- Literature Corpus work
- a7df75e4-3f00-5841-9c21-3133bd6cb992
- DOI
- 10.21203/rs.3.rs-10521147/v1
