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A Combinatorial Approach of Biparental QTL Mapping and Genome-Wide Association Analysis Identifies Candidate Genes for Phytophthora Blight Resistance in Sesame

2020-03-18

Abstract excerpt

<h4>Summary</h4> Phytophthora blight, caused by pathogen Phytophthora nicotianae , is responsible for a huge reduction in sesame ( Sesamum indicum L.) crop yields. In this study, we utilized a combinatorial approach involving biparental QTL mapping and genome-wide association (GWAS) analysis to identify genes associated with Phytophthora blight resistance in sesame. Evaluation of resistant of the parental varie...

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Literature Corpus work
6ede24d3-7b8a-53d3-8194-7a62abdb38be
DOI
10.1101/2020.03.18.996637
Open publication

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A Combinatorial Approach of Biparental QTL Mapping and Genome-Wide Association Analysis Identifies Candidate Genes for Phytophthora Blight Resistance in SesameDOI 10.1101/2020.03.18.996637
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