Article
Meta-QTL analysis of tan spot resistance in wheat.
TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik - 1 Aug 2020
Liu Yuan, Salsman Evan, Wang Runhao, Galagedara Nelomie, Zhang Qijun, Fiedler Jason D, Liu Zhaohui, Xu Steven, Faris Justin D, Li Xuehui
Abstract excerpt
KEY MESSAGE: A total of 19 meta-QTL conferring resistance to tan spot were identified from 104 initial QTL detected in 15 previous QTL mapping studies. Tan spot, caused by the fungal pathogen Pyrenophora tritici-repentis (Ptr), is a major foliar disease worldwide in both bread wheat and durum wheat and can reduce grain yield due to reduction in photosynthetic area of leaves. Developing and growing resistant...
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