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Defect Diagnostics in Thin Film Photovoltaics: Leveraging Macroscopic J-V Characteristics for Microscopic Insights via Machine Learning

2025-08-14

Abstract excerpt

Accurately diagnosing microscopic defect properties from macroscopic J-V characteristics in thin-film photovoltaics remains a critical barrier to advancing solar cell efficiency. While experimental techniques like DLTS and admittance spectroscopy directly probe defect states, their widespread adoption is limited by complexity and cost. This study presents an innovative AI-driven framework, using CIGS solar cells a...

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Literature Corpus work
1072da60-8ee3-5f7e-bbf2-fbf188c0875c
DOI
10.22541/au.175519083.36182187/v1
Open publication

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Defect Diagnostics in Thin Film Photovoltaics: Leveraging Macroscopic J-V Characteristics for Microscopic Insights via Machine LearningDOI 10.22541/au.175519083.36182187/v1
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