Article
Defect Diagnostics in Thin Film Photovoltaics: Leveraging Macroscopic J-V Characteristics for Microscopic Insights via Machine Learning
2025-08-14
Abstract excerpt
Accurately diagnosing microscopic defect properties from macroscopic J-V characteristics in thin-film photovoltaics remains a critical barrier to advancing solar cell efficiency. While experimental techniques like DLTS and admittance spectroscopy directly probe defect states, their widespread adoption is limited by complexity and cost. This study presents an innovative AI-driven framework, using CIGS solar cells a...
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Identifiers and source
- Literature Corpus work
- 1072da60-8ee3-5f7e-bbf2-fbf188c0875c
- DOI
- 10.22541/au.175519083.36182187/v1
