Article
Rapid phenotypic analysis of uncoated Drosophila samples with low-vacuum scanning electron microscopy.
Fly - 1 Jan 2000
Tardi Nicholas J, Cook Martha E, Edwards Kevin A
Abstract excerpt
Research projects featuring repetitive phenotypic analysis of insects, such as taxonomic studies, quantitative genetics, and mutant screens, could be greatly facilitated by a simpler approach to scanning electron microscopy (SEM). Here, we have applied low-vacuum SEM to wild type and mutant Drosophila and demonstrate that high quality ultrastructure data can be obtained quickly using minimal preparation. Adult...
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