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Article

Mapping of verticillium wilt resistance genes in cotton

2005-06-01

Abstract excerpt

Cotton quality and yield are affected by several factors during the growing season. A soil inhabiting fungus, Verticillium dahliae Kleb., can cause substantial yield loss in cotton. A molecular mapping F2 population derived from the interspecific cross of the highly tolerant Gossypium barbadense cv. Pima S-7 and the susceptible G. hirsutum cv. Acala 44 was phenotyped for disease incidence and severity. Phenotyping...

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Literature Corpus work
d086782b-55f8-52d4-b51d-2d09d811a0a7
DOI
10.1016/j.plantsci.2005.02.008
Open publication

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Mapping of verticillium wilt resistance genes in cottonDOI 10.1016/j.plantsci.2005.02.008
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