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Multiple environmental test and genetic mapping jointly reveal genomic loci and associated genes underlying cotton Verticillium wilt resistance.

TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik - 18 Jul 2026

Zhang Yalin, Zhao Lihong, Li Ziming, Liu Binhui, Lv Junyuan, Feng Zili, Wei Feng, Zhou Jinglong, Han Jiangping, Song Yong, Zhu Heqin, Feng Hongjie, Ma Zhiying

Abstract excerpt

KEY MESSAGE: Based on GWAS, QTL mapping, BSA and RNA‒seq jointly reveal the genetic mechanisms underlying Verticillium wilt resistance in cotton and identify three candidate genes associated with this trait. Verticillium wilt, caused by the soil-borne vascular pathogen Verticillium dahliae, is a devastating disease that severely threatens global cotton production. However, the genetic basis of resistance to this...

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PMID: 42470455
DOI: 10.1007/s00122-026-05320-8

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F8

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