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Intravesical Migration of a Copper Intrauterine Device: A Rare Cause of Chronic Lower Urinary Tract Symptoms

2025-11-06

Abstract excerpt

<title>Abstract</title> <p> Background: Intrauterine devices (IUDs) are widely used and generally safe contraceptive methods. Complications such as uterine perforation and extrauterine migration are rare. Bladder migration is uncommon and is predominantly reported with copper-containing IUDs <sup>1–4</sup> Case presentation: We report a 46-year-old woman with a history of copper IUD placement three years prior...

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Literature Corpus work
c7c343e6-14c0-5e1a-9cbb-fea92d09b6e0
DOI
10.21203/rs.3.rs-7615861/v1
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Intravesical Migration of a Copper Intrauterine Device: A Rare Cause of Chronic Lower Urinary Tract SymptomsDOI 10.21203/rs.3.rs-7615861/v1
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