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SimuScan: Label-Free Deep Learning for Autonomous AFM

2025-10-13

Abstract excerpt

<title>Abstract</title> <p>Atomic force microscopy (AFM) underpins nanoscale research across materials, energy, and biology. Yet its utility is restricted by low imaging throughput and the requirement for a highly skilled operator. Progress toward autonomous operation is hindered by the scarcity of annotated datasets and the poor generalizability of existing models. To overcome this, we introduce a synthetic data...

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Literature Corpus work
c3167320-f692-5662-b9cf-4260f5db8bed
DOI
10.21203/rs.3.rs-7724735/v1
Open publication

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SimuScan: Label-Free Deep Learning for Autonomous AFMDOI 10.21203/rs.3.rs-7724735/v1
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