Article
SimuScan: Label-Free Deep Learning for Autonomous AFM
2025-10-13
Abstract excerpt
<title>Abstract</title> <p>Atomic force microscopy (AFM) underpins nanoscale research across materials, energy, and biology. Yet its utility is restricted by low imaging throughput and the requirement for a highly skilled operator. Progress toward autonomous operation is hindered by the scarcity of annotated datasets and the poor generalizability of existing models. To overcome this, we introduce a synthetic data...
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Identifiers and source
- Literature Corpus work
- c3167320-f692-5662-b9cf-4260f5db8bed
- DOI
- 10.21203/rs.3.rs-7724735/v1
