Article

Feature vector based analysis of hyperspectral crop reflectance data for discrimination and quantification of fungal disease severity in wheat

2003-10-01

Abstract excerpt

The impact of plant pathological stress on crop reflectance can be measured both in broad-band vegetation indices and in narrow or local characteristics of the reflectance spectra. This work is concerned with using the whole spectra in the objective examination of how different parts of the spectrum contribute in describing disease severity in wheat. A hyperspectral reflectance spectrum was considered as a mixed s...

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Identifiers and source

Literature Corpus work: ae04d511-8669-559c-a611-3c513799f51a
DOI: 10.1016/s1537-5110(03)00090-4

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