Article

Evaluation of spectral indices and continuous wavelet analysis to quantify aphid infestation in wheat

2013-04-01

Abstract excerpt

Wheat aphid, Sitobion avenae F. is one of the most destructive insects infesting winter wheat and appears almost annually in northwest China. Past studies have demonstrated the potential of remote sensing for detecting crop diseases and insect damage. This study aimed to investigate the spectroscopic estimation of leaf aphid density by applying continuous wavelet analysis to the reflectance spectra (350–2 500 nm)...

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Literature Corpus work: 787a3125-89fc-532d-9004-49941b7b3983
DOI: 10.1007/s11119-012-9283-4

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