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Atmospheric Pressure Plasma Induced Ionization Fluorescence Spectroscopy for Label-Free Optical Characterization of Organic and Inorganic Particulate Materials

2026-08-07

Abstract excerpt

Atmospheric-pressure plasma optical emission spectroscopy (OES) is a promising technique for rapid, and label-free characterization of particulate materials because of its ability to generate material-dependent optical emission signatures under ambient conditions. In this work, an enhanced plasma-induced ionization fluorescence spectroscopy (PIFS) platform based on an open atmospheric-pressure discharge configurat...

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Literature Corpus work
42a67737-2075-5a15-b630-947249fbba54
DOI
10.20944/preprints202608.0514.v1
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Atmospheric Pressure Plasma Induced Ionization Fluorescence Spectroscopy for Label-Free Optical Characterization of Organic and Inorganic Particulate MaterialsDOI 10.20944/preprints202608.0514.v1
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