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Genome-Wide Association Study and Transcriptome Analysis of Candidate Resistance Genes for Northern Corn Leaf Blight.

Plant disease - 1 Jul 2026

Wen Shenghui, Meng Lingzhi, Yang Junwei, Zhang Ao, Ma Zhoujie, Zhao Bianping, Wang Yang, Jia Xin, Li Yanliang, Wang Xingxing, Duan Canxing, Weng Jianfeng, Xu Zhennan, Wang Jianjun

Abstract excerpt

Northern corn leaf blight (NCLB) is a leaf disease caused by Setosphaeria turcica that infects maize at multiple growth stages and severely impairs photosynthesis and grain yield. Breeding for resistance to NCLB would be an effective strategy to mitigate the damage caused by this disease. Mapping of resistance genes provides an opportunity to understand the resistance mechanisms and to utilize the information in...

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PMID: 41200758
DOI: 10.1094/PDIS-05-25-1016-RE

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