Article
Genome-wide association studies in tropical maize germplasm reveal novel and known genomic regions for resistance to Northern corn leaf blight.
Scientific reports - 15 Dec 2020
Rashid Zerka, Sofi Mehrajuddin, Harlapur Sharanappa I, Kachapur Rajashekhar M, Dar Zahoor Ahmed, Singh Pradeep Kumar, Zaidi Pervez Haider, Vivek Bindiganavile Sampath, Nair Sudha Krishnan
Abstract excerpt
Northern Corn Leaf Blight (NCLB) caused by Setosphaeria turcica, is one of the most important diseases of maize world-wide, and one of the major reasons behind yield losses in maize crop in Asia. In the present investigation, a high-resolution genome wide association study (GWAS) was conducted for NCLB resistance in three association mapping panels, predominantly consisting of tropical lines adapted to different...
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