Article
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize.
BMC plant biology - 20 Aug 2015
Ding Junqiang, Ali Farhan, Chen Gengshen, Li Huihui, Mahuku George, Yang Ning, Narro Luis, Magorokosho Cosmos, Makumbi Dan, Yan Jianbing
Abstract excerpt
BACKGROUND: Northern corn leaf blight (NCLB) caused by Exserohilum turcicum is a destructive disease in maize. Using host resistance to minimize the detrimental effects of NCLB on maize productivity is the most cost-effective and appealing disease management strategy. However, this requires the identification and use of stable resistance genes that are effective across different environments. RESULTS: We...
Read the complete abstract on PubMedTopics
Share this publication in a Topic to start or enrich a Post.
