Article
Reflectance Spectroscopy for Non-Destructive Measurement and Genetic Analysis of Amounts and Types of Epicuticular Waxes on Onion Leaves.
Molecules (Basel, Switzerland) - 29 Jul 2020
Munaiz Eduardo D, Townsend Philip A, Havey Michael J
Abstract excerpt
Epicuticular waxes on the surface of plant leaves are important for the tolerance to abiotic stresses and plant-parasite interactions. In the onion (Allium cepa L.), the variation for the amounts and types of epicuticular waxes is significantly associated with less feeding damage by the insect Thrips tabaci (thrips). Epicuticular wax profiles are measured using used gas chromatography mass spectrometry (GCMS),...
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