Article
QTL mapping identifies a major locus for resistance in wheat to Sunn pest (Eurygaster integriceps) feeding at the vegetative growth stage.
TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik - 1 Feb 2017
Emebiri L C, Tan M-K, El-Bouhssini M, Wildman O, Jighly A, Tadesse W, Ogbonnaya F C
Abstract excerpt
KEY MESSAGE: This research provides the first report of a major locus controlling wheat resistance to Sunn pest. It developed and validated SNP markers that will be useful for marker-assisted selection. Sunn pest (Eurygaster integriceps Puton) is the most destructive insect pest of bread wheat and durum wheat in West and Central Asia and East Europe. Breeding for resistance at the vegetative stage of growth is...
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