Article

Relationship of plant height and days to maturity with resistance to spot blotch in wheat.

2002-01-01

Abstract excerpt

A total of 1,407 spring wheat ( T. aestivum) lines of Indian and CIMMYT (International Maize and Wheat Improvement Centre, Mexico) origin were evaluated for plant height, days to maturity and resistance to spot blotch (caused by Bipolaris sorokiniana) during the 199495, 199596 and 199697 crop seasons. The frequency distribution of genotypes, based on disease score ignoring the growth stages, diff...

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Literature Corpus work: 888d715d-5764-5d79-9923-1f876d85e3c4
DOI: 10.1023/a:1014922416058

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