Article

Linkage of Lr55 wheat leaf rust resistance gene with microsatellite and DArT-based markers

2021-08-01

Abstract excerpt

Every year, leaf rust causes losses of wheat yield and quality all around the world. Breeding of cereals resistant to fungal diseases offers a long-term alternative for chemical protection and becomes increasingly important for organic farming and ecological food production. Accumulation of effective resistance genes in a single genotype requires recurrent enrichment of the wheat genepool with promising resistance...

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Literature Corpus work: 65be8483-2312-53a4-9e9e-ae9e1f4b4241
DOI: 10.1016/j.pmpp.2021.101674

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