Back to search

Article

Molecular mapping of leaf rust resistance gene LrBi16 in Chinese wheat cultivar Bimai 16

2011-12-01

Abstract excerpt

Leaf rust, caused by Puccinia triticina, is one of the most widespread diseases in common wheat (Triticum aestivum L.) globally. With the objective of identifying and mapping new genes for resistance to leaf rust, F1, F2 plants and F3 lines from a cross between resistant cultivar Bimai 16 and susceptible cultivar Thatcher were inoculated with Chinese Puccinia triticina pathotypes FHTT and PHTS in the greenhouse. I...

Topics

Open a Topic to create a Post that cites this publication.

Identifiers and source

Literature Corpus work
3777ff74-6ab8-5dea-8719-9b326451e60e
DOI
10.1007/s11032-010-9501-6
Open publication

Related research

Semantic proximity does not establish scientific evidence.

Click a neighbor to travelStep 1 · 12 closest
Interactive article relationship graphSelect a related publication card to move it into the centre and load its closest explainable connections. Solid lines are source-backed structured connections. Dashed lines are semantic discovery signals and are not scientific evidence.
Molecular mapping of leaf rust resistance gene LrBi16 in Chinese wheat cultivar Bimai 16DOI 10.1007/s11032-010-9501-6
Select a neighboring publication to make it the new centre.