Article
Genetic mapping of a major gene for leaf rust resistance in soft red winter wheat cultivar AGS 2000
2019-01-01
Abstract excerpt
Leaf rust (LR), caused by Puccinia triticina (Pt), is a major disease of wheat worldwide. Genetic resistance is the most effective, economic, and environmentally safe method to reduce losses caused by LR. Seventy-nine LR resistance genes have been identified so far; however, only a few of them are still effective due to the constant evolution of new Pt races. The objectives of this study were to characterize the g...
Topics
Open a Topic to create a Post that cites this publication.
Identifiers and source
- Literature Corpus work
- 03e7d1ce-441b-52e9-a41c-b17be09bd611
- DOI
- 10.1007/s11032-018-0909-8
