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Genetic dissection of southern corn leaf blight resistance in sweet corn through genome-wide association studies and genomic selection.

The plant genome - 1 Sept 2026

Lantican Darlon V, Gonzalez Juan M, Peixoto Marco Antonio, Leach Kristen A, Ferreira Larissa Carvalho, de Moura Vitor A Silva, Xavier Katia V, Balint-Kurti Peter, Tracy William, Resende Marcio F R

Abstract excerpt

Southern corn leaf blight (SCLB) is caused by the fungal pathogen Bipolaris maydis (syn. Cochliobolus heterostrophus Drechsler) and is a common disease of fall crops of sweet corn. Phenotyping for SCLB resistance is performed through visual scoring, which is subjective and may limit genetic gain for this quantitative trait. As an alternative, we integrated computer vision (CV)-based phenotyping, genome-wide...

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Ascomycota
Disease Resistance
Genome, Plant
Genome-Wide Association Study
Plant Diseases

Methodology Data sources Editorial policy Privacy About Contact Helena Bioinformatics

Polymorphism, Single Nucleotide

Selection, Genetic

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Identifiers

PMID: 42444097
DOI: 10.1002/tpg2.70271
PMCID: PMC13365670

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PubMed metadata and Literature Corpus relationships. Corpus snapshot updated 1 Sept 2026.

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