Article
Genetic identification and characterization of novel loci for flag leaf morphology traits in Chinese endemic wheat.
The plant genome - 1 Jun 2026
Lohani Md Nahibuzzaman, Su Longxing, Lu Lu, Yin Li, Liu Yanlin, Xu Qiang, Jiang Yunfeng, Jiang Qiantao, Chen Guoyue, Wei Yuming, Liu Chunji, Xie Quan, Ma Jian
Abstract excerpt
Flag leaf morphology (FLM) is a critical determinant of wheat (Triticum aestivum L.) photosynthetic efficiency and grain yield. Chinese endemic wheat, a unique genetic reservoir formed by long-term adaptation to diverse and heterogeneous environments in China, harbors abundant, untapped allelic variation for traits related to environmental resilience and yield architecture. Mining this distinctive germplasm is...
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