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Genetic basis of flag leaf thickness and its contribution to yield in wheat (Triticum aestivum L.).

BMC plant biology - 29 Dec 2025

Niu Yanan, Huang Qixiang, Yang Huankun, Chen Tianxiao, Zhao Chenchen, Zheng Fei, Liu Chunji, Hu Haiyan, Zhang Guoping, Ye Lingzhen, Zhou Meixue

Abstract excerpt

BACKGROUND: Previous studies on leaf morphological traits are predominantly focused on flag leaf length (FLL), width (FLW), and area (FLA), which are known to affect light interception. However, limited research has addressed on flag leaf thickness (FLT) and its intricate relationship with various yield components. Recent studies have highlighted the importance of FLT in determining photosynthetic capacity and...

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PMID: 41457270
DOI: 10.1186/s12870-025-08014-3
PMCID: PMC12859943

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