Article
Comparison of Models and Whole-Genome Profiling Approaches for Genomic-Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat.
The plant genome - 1 Jul 2017
Juliana Philomin, Singh Ravi P, Singh Pawan K, Crossa Jose, Rutkoski Jessica E, Poland Jesse A, Bergstrom Gary C, Sorrells Mark E
Abstract excerpt
The leaf spotting diseases in wheat that include Septoria tritici blotch (STB) caused by , Stagonospora nodorum blotch (SNB) caused by , and tan spot (TS) caused by pose challenges to breeding programs in selecting for resistance. A promising approach that could enable selection prior to phenotyping is genomic selection that uses genome-wide markers to estimate breeding values (BVs) for quantitative traits. To...
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