Article
Use of base excision sequence scanning for detection of genetic variations in St. Louis encephalitis virus isolates.
Journal of clinical microbiology - 1 Jun 1999
Charrel R N, Lévy N, Tesh R B, Chandler L J
Abstract excerpt
Twenty-two isolates of St. Louis encephalitis (SLE) virus of various geographical origins (Brazil, Argentina, Panama, Texas, Missouri, Maryland, California, and Florida) were examined for genetic variation by the base excision sequence scanning (BESS T-scan) method. A fragment was amplified in the envelope gene with the forward primer labeled in the PCR. The BESS T-scan method determined different clusters...
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