Back to search

Article

Double dose efficiency of the yellow rust resistance gene Yr17 in bread wheat lines

2020-04-01

Abstract excerpt

Yellow rust, caused by Puccinia striiformis f. sp. tritici, is one of the most severe wheat disease worldwide. Crop losses have ranged from 10% to 70% and up to 100% in extreme conditions. Eighty‐two resistance genes, designated Yr, have been identified. Among them, Yr17 derived from Aegilops ventricosa and located on chromosome 2A has been widely used in wheat breeding. However, it had been overcome already. Thro...

Topics

Open a Topic to create a Post that cites this publication.

Identifiers and source

Literature Corpus work
e4cb9b2d-0b8a-515b-858b-de7d0780d2a9
DOI
10.1111/pbr.12768
Open publication

Related research

Semantic proximity does not establish scientific evidence.

Click a neighbor to travelStep 1 · 12 closest
Interactive article relationship graphSelect a related publication card to move it into the centre and load its closest explainable connections. Solid lines are source-backed structured connections. Dashed lines are semantic discovery signals and are not scientific evidence.
Double dose efficiency of the yellow rust resistance gene Yr17 in bread wheat linesDOI 10.1111/pbr.12768
Select a neighboring publication to make it the new centre.