Article
Identification and Validation of Stable Loci Underlying Productivity-Related Traits in Common Wheat.
International journal of molecular sciences - 5 Jun 2026
Kiseleva Antonina A, Leonova Irina N, Nesterov Mikhail A, Piskarev Vyacheslav V, Salina Elena A
Abstract excerpt
The genetic architecture of wheat yield-related traits is complex due to their polygenic control, relatively low heritability, and strong genotype-environment interactions. Commonly used characteristics of wheat productivity include thousand-grain weight (TGW), grain weight per ear (GWE), and grain number per ear (GNE). To identify stable loci associated with productivity-related traits in common wheat, we...
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