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Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat.

BMC plant biology - 21 Dec 2024

Lv Yuxia, Dong Liansheng, Wang Xiatong, Shen Linhong, Lu Wenbo, Si Fan, Zhao Yaoyao, Zhu Guanju, Ding Yiting, Cao Shujun, Cao Jiajia, Lu Jie, Ma Chuanxi, Chang Cheng, Zhang Haiping

Abstract excerpt

Genetic dissection of yield-related traits can be used to improve wheat yield through molecular design breeding. In this study, we genotyped 245 wheat varieties and measured 13 yield-related plant height-, grain-, and spike-related traits, in seven environments, and identified 778 loci for these traits by genome-wide association study (GWAS) using single- and multi-locus models. Among these loci, nine were major,...

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PMID: 39709400
DOI: 10.1186/s12870-024-05956-y
PMCID: PMC11662590

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