Article
Using two self-developed InDel panels to explore forensic traits and ancestral components in the Hui group.
Genomics - 1 Jan 2024
Yuan Xi, Wang Xi, Lan Qiong, Li Shuanglin, Lin Yifeng, Zhao Ming, Xu Hui, Lei Fanzhang, Shen Chunmei, Zhu Bofeng
Abstract excerpt
To address the challenges faced by forensic examiners in degraded DNA analysis, we have developed two different panels for various forensic applications, encompassing an AIM-InDel panel for ancestry inference and a Multi-InDel panel for individual identification, respectively. Herein, the efficiencies of these two panels were tested in the Chinese Hui group. By calculating forensic parameters and simulating...
Read the complete abstract on PubMedTopics
Share this publication in a Topic to start or enrich a Post.
