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Article

Identification and Validation of Quantitative Trait Loci Mapping for Spike-Layer Uniformity in Wheat.

International journal of molecular sciences - 19 Jan 2022

Zhou Kunyu, Lin Yu, Jiang Xiaojun, Zhou Wanlin, Wu Fangkun, Li Caixia, Wei Yuming, Liu Yaxi

Abstract excerpt

Spike-layer uniformity (SLU), the consistency of the spike distribution in the vertical space, is an important trait. It directly affects the yield potential and appearance. Revealing the genetic basis of SLU will provide new insights into wheat improvement. To map the SLU-related quantitative trait loci (QTL), 300 recombinant inbred lines (RILs) that were derived from a cross between H461 and Chinese Spring were...

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PMID: 35162974
DOI: 10.3390/ijms23031052
PMCID: PMC8835109

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