Article
Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines.
Scientific reports - 4 Mar 2021
Juliana Philomin, Singh Ravi Prakash, Poland Jesse, Shrestha Sandesh, Huerta-Espino Julio, Govindan Velu, Mondal Suchismita, Crespo-Herrera Leonardo Abdiel, Kumar Uttam, Joshi Arun Kumar, Payne Thomas, Bhati Pradeep Kumar, Tomar Vipin, Consolacion Franjel, Campos Serna Jaime Amador
Abstract excerpt
Wheat grain yield (GY) improvement using genomic tools is important for achieving yield breakthroughs. To dissect the genetic architecture of wheat GY potential and stress-resilience, we have designed this large-scale genome-wide association study using 100 datasets, comprising 105,000 GY observations from 55,568 wheat lines evaluated between 2003 and 2019 by the International Maize and Wheat Improvement Center...
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