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Article

Genome-wide association mapping for resistance to leaf rust, stripe rust and tan spot in wheat reveals potential candidate genes.

TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik - 1 Jul 2018

Juliana Philomin, Singh Ravi P, Singh Pawan K, Poland Jesse A, Bergstrom Gary C, Huerta-Espino Julio, Bhavani Sridhar, Crossa Jose, Sorrells Mark E

Abstract excerpt

KEY MESSAGE: Genome-wide association mapping in conjunction with population sequencing map and Ensembl plants was used to identify markers/candidate genes linked to leaf rust, stripe rust and tan spot resistance in wheat. Leaf rust (LR), stripe rust (YR) and tan spot (TS) are some of the important foliar diseases in wheat (Triticum aestivum L.). To identify candidate resistance genes for these diseases in...

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Identifiers

PMID: 29589041
DOI: 10.1007/s00122-018-3086-6
PMCID: PMC6004277

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PubMed metadata and Literature Corpus relationships. Corpus snapshot updated 7 Sept 2026. Manifest publication-graph-cohort-2026-09-07.1.

Source receipt: pubmed, retrieved 7 Sept 2026.

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