Studies on wheat mutants induced by nitrogen ion beam implantation.

Abstract excerpt

As a new resource of mutagens,low-energy ion beam implantation is characterized as limited physiological damages,wide mutation spectrum, and high mutation frequency in comparison with the mutations from other inducing methods. We treated a wheat doubled haploid line Yi4212 with this technique by nitrogen ion and established a mutant population with 60 lines in our lab. The mutant lines were systematically...

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